Zone plate tilt study in transmission X-ray microscope system at 8-11 keV

Fu Han Chao*, Gung Chian Yin, Keng S. Liang, Yin-Chieh Lai

*Corresponding author for this work

研究成果: Conference contribution同行評審

1 引文 斯高帕斯(Scopus)

摘要

Zone plate [1] has been used as a focal lens in transmission X-ray microscope (TXM) optical system in recent decades [2, 3]. In TXM of NSRRC[4,5], the thickness of zone plate is about 900nm and the width of its out most zones is 50nm, which has a high aspect ratio 18. When zone plate is tilted, the image quality will be affected by aberration. Since the aspect ratio of zone plate is large, for incident beam, the shape of zone plate's transmission function will look different when zone plate is tilted. The both experimental and simulation result will be shown in this present. A five axes stage is designed and manufactured for the zone plate holder for three dimensional movement, tip and tilt. According to Fourier theory, we can calculate the wave distribution on image plane, if we know the original wave function, the distances between each element, and the transparencies of the sample and zone plate. A parallel simulation process code in MATLAB is developed in workstation cluster with up to 128Gbytes memory. The effects of aberration generated by tilt effect are compared from the experimental data and simulation result. A maximum tilt angle within the acceptable image quality is calculated by simulation and will be verified by experiment.

原文English
主出版物標題Advances in X-Ray/EUV Optics and Components IV
DOIs
出版狀態Published - 19 十一月 2009
事件Advances in X-Ray/EUV Optics and Components IV - San Diego, CA, United States
持續時間: 3 八月 20095 八月 2009

出版系列

名字Proceedings of SPIE - The International Society for Optical Engineering
7448
ISSN(列印)0277-786X

Conference

ConferenceAdvances in X-Ray/EUV Optics and Components IV
國家United States
城市San Diego, CA
期間3/08/095/08/09

指紋 深入研究「Zone plate tilt study in transmission X-ray microscope system at 8-11 keV」主題。共同形成了獨特的指紋。

引用此