Zirconia nucleating agent on microstructural and electrical properties of a CaMgSi 2 O 6 diopside glass-ceramic for microwave dielectrics

Kuei Chih Feng*, Chen Chia Chou, Li Wen Chu, H. D. Chen

*Corresponding author for this work

研究成果: Article

25 引文 斯高帕斯(Scopus)

摘要

Addition of different amount of zirconia (ZrO 2 ) nucleating agent into MgO-CaO-SiO 2 system to enhance the quality factor (Q × f) of CaMgSi 2 O 6 diopside glass-ceramic for low sintering temperature process (from 850 to 950 °C) was carried out in this work. The microstructures, microwave dielectric properties and nucleating/growth mechanism of m-ZrO 2 added CaMgSi 2 O 6 system were analyzed using transmission electron microscopy (TEM) and electrical property measurements. Experimental results demonstrate that a solid solution of an amorphous phase MgO-CaO-SiO 2 and ZrO 2 forms after melted at 1500 °C. The t-ZrO 2 appears in the amorphous matrix first and then crystalline CaMgSi 2 O 6 particle grows up at around the boundary of t-ZrO 2 after thermal treatment at 850 °C due to heterogeneous nucleating. Formation of t-ZrO 2 is attributed to diffusion of Ca 2+ to stabilize the m-ZrO 2 . The quality factor of CaMgSi 2 O 6 was significantly enhanced by adding 3 wt.% m-ZrO 2 , indicating that the ZrO 2 nucleating agent could enhance crystallization and therefore increase the quality factor.

原文English
頁(從 - 到)2851-2855
頁數5
期刊Materials Research Bulletin
47
發行號10
DOIs
出版狀態Published - 1 十月 2012

指紋 深入研究「Zirconia nucleating agent on microstructural and electrical properties of a CaMgSi <sub>2</sub> O <sub>6</sub> diopside glass-ceramic for microwave dielectrics」主題。共同形成了獨特的指紋。

引用此