Vertical SCR structure for on-chip ESD protection in nanoscale CMOS technology

Chun Yu Lin, Pin Hsin Chang, Rong Kun Chang, Ming-Dou Ker, Wen Tai Wang

研究成果: Conference contribution同行評審

2 引文 斯高帕斯(Scopus)

指紋 深入研究「Vertical SCR structure for on-chip ESD protection in nanoscale CMOS technology」主題。共同形成了獨特的指紋。

Engineering & Materials Science