Use of random telegraph signal as internal probe to study program/erase charge lateral spread in a SONOS flash memory

Y. L. Chou, J. P. Chiu, H. C. Ma, Ta-Hui Wang, Y. P. Chao, K. C. Chen, Chih Yuan Lu

研究成果: Conference contribution同行評審

3 引文 斯高帕斯(Scopus)

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Engineering & Materials Science