Transient-to-digital converter for ESD protection design in microelectronic systems

Ming-Dou Ker*, Cheng Cheng Yen, Chi Sheng Liao, Tung Yang Chen, Chih Chung Tsai

*Corresponding author for this work

研究成果: Conference contribution同行評審

2 引文 斯高帕斯(Scopus)

摘要

An on-chip transient-to-digital converter for system-level electrostatic discharge (ESD) protection is proposed. The proposed transient-to-digital converter is designed to detect fast electrical transients during the system-level ESD events. The output digital thermometer codes can correspond to different ESD voltages under system-level ESD tests. The experimental results in a 0.18-μm CMOS integrated circuit (IC) with 3.3-V devices have confirmed the detection function and digital output codes.

原文English
主出版物標題Proceedings of 2008 IEEE Asian Solid-State Circuits Conference, A-SSCC 2008
頁面409-412
頁數4
DOIs
出版狀態Published - 1 十二月 2008
事件2008 IEEE Asian Solid-State Circuits Conference, A-SSCC 2008 - Fukuoka, Japan
持續時間: 3 十一月 20085 十一月 2008

出版系列

名字Proceedings of 2008 IEEE Asian Solid-State Circuits Conference, A-SSCC 2008

Conference

Conference2008 IEEE Asian Solid-State Circuits Conference, A-SSCC 2008
國家Japan
城市Fukuoka
期間3/11/085/11/08

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