Transient-Induced Latchup in CMOS Integrated Circuits

Ming-Dou Ker*, Sheng Fu Hsu

*Corresponding author for this work

研究成果: Book同行評審

33 引文 斯高帕斯(Scopus)

指紋 深入研究「Transient-Induced Latchup in CMOS Integrated Circuits」主題。共同形成了獨特的指紋。

Engineering & Materials Science