Transient detection circuit for system-level ESD protection and its on-board behavior with EMI/EMC filters

Ming-Dou Ker, Chi Sheng Liao, Cheng Cheng Yen

研究成果: Conference article

4 引文 斯高帕斯(Scopus)

摘要

A new on-chip transient detection circuit for system-level electrostatic discharge (ESD) protection is proposed. The circuit performance of detecting fast electrical transients has been verified in a 0.18-μm CMOS integrated circuit (IC). The experimental results have confirmed that the proposed on-chip transient detection circuit can detect positive and negative fast electrical transients during system-level ESD zapping. Three board-level noise filtering networks have been investigated their enhancement on detection range of the proposed on-chip transient detection circuit. The chip-level solution can be further co-designed with the board-level solution in order to meet high system-level ESD specification.

原文English
文章編號4652088
期刊IEEE International Symposium on Electromagnetic Compatibility
2008-January
DOIs
出版狀態Published - 1 一月 2008
事件2008 IEEE International Symposium on Electromagnetic Compatibility, EMC 2008 - Detroit, MI, Germany
持續時間: 18 八月 200822 八月 2008

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