Transient detection circuit for system-level ESD protection and its on-board behavior with EMI/EMC filters

Ming-Dou Ker; Chi Sheng Liao; Cheng Cheng Yen

doi:10.1109/ISEMC.2008.4652088

Transient detection circuit for system-level ESD protection and its on-board behavior with EMI/EMC filters

Ming-Dou Ker, Chi Sheng Liao, Cheng Cheng Yen

電子工程學系

研究成果: Conference article › 同行評審

4 引文斯高帕斯（Scopus）

摘要

A new on-chip transient detection circuit for system-level electrostatic discharge (ESD) protection is proposed. The circuit performance of detecting fast electrical transients has been verified in a 0.18-μm CMOS integrated circuit (IC). The experimental results have confirmed that the proposed on-chip transient detection circuit can detect positive and negative fast electrical transients during system-level ESD zapping. Three board-level noise filtering networks have been investigated their enhancement on detection range of the proposed on-chip transient detection circuit. The chip-level solution can be further co-designed with the board-level solution in order to meet high system-level ESD specification.

原文	English
文章編號	4652088
期刊	IEEE International Symposium on Electromagnetic Compatibility
卷	2008-January
DOIs	https://doi.org/10.1109/ISEMC.2008.4652088
出版狀態	Published - 1 一月 2008
事件	2008 IEEE International Symposium on Electromagnetic Compatibility, EMC 2008 - Detroit, MI, Germany 持續時間: 18 八月 2008 → 22 八月 2008

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10.1109/ISEMC.2008.4652088

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引用此

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abstract = "A new on-chip transient detection circuit for system-level electrostatic discharge (ESD) protection is proposed. The circuit performance of detecting fast electrical transients has been verified in a 0.18-μm CMOS integrated circuit (IC). The experimental results have confirmed that the proposed on-chip transient detection circuit can detect positive and negative fast electrical transients during system-level ESD zapping. Three board-level noise filtering networks have been investigated their enhancement on detection range of the proposed on-chip transient detection circuit. The chip-level solution can be further co-designed with the board-level solution in order to meet high system-level ESD specification.",

keywords = "Detection circuit, Electrostatic discharge (ESD), ESD protection circuit, System-level ESD test",

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N2 - A new on-chip transient detection circuit for system-level electrostatic discharge (ESD) protection is proposed. The circuit performance of detecting fast electrical transients has been verified in a 0.18-μm CMOS integrated circuit (IC). The experimental results have confirmed that the proposed on-chip transient detection circuit can detect positive and negative fast electrical transients during system-level ESD zapping. Three board-level noise filtering networks have been investigated their enhancement on detection range of the proposed on-chip transient detection circuit. The chip-level solution can be further co-designed with the board-level solution in order to meet high system-level ESD specification.

AB - A new on-chip transient detection circuit for system-level electrostatic discharge (ESD) protection is proposed. The circuit performance of detecting fast electrical transients has been verified in a 0.18-μm CMOS integrated circuit (IC). The experimental results have confirmed that the proposed on-chip transient detection circuit can detect positive and negative fast electrical transients during system-level ESD zapping. Three board-level noise filtering networks have been investigated their enhancement on detection range of the proposed on-chip transient detection circuit. The chip-level solution can be further co-designed with the board-level solution in order to meet high system-level ESD specification.

KW - Detection circuit

KW - Electrostatic discharge (ESD)

KW - ESD protection circuit

KW - System-level ESD test

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