Thermal stability of SiGe dynamic threshold pMOSFET

W. M. Liao*, C. F. Shih, Pei-Wen Li

*Corresponding author for this work

研究成果: Paper

1 引文 斯高帕斯(Scopus)
原文English
頁面137-140
頁數4
出版狀態Published - 5 十二月 2005
事件12th International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2005 - Singapore, Singapore
持續時間: 27 六月 20051 七月 2005

Conference

Conference12th International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2005
國家Singapore
城市Singapore
期間27/06/051/07/05

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