The variability issues in small scale strained CMOS devices: Random dopant and trap induced fluctuations

Steve S. Chung*

*Corresponding author for this work

研究成果: Conference contribution同行評審

6 引文 斯高帕斯(Scopus)

指紋 深入研究「The variability issues in small scale strained CMOS devices: Random dopant and trap induced fluctuations」主題。共同形成了獨特的指紋。

Engineering & Materials Science