The understanding of the bulk trigate MOSFET's reliability through the manipulation of RTN traps
E. R. Hsieh, P. C. Wu, Steve S. Chung, C. H. Tsai, R. M. Huang, C. T. Tsai
研究成果: Conference contribution › 同行評審
E. R. Hsieh, P. C. Wu, Steve S. Chung, C. H. Tsai, R. M. Huang, C. T. Tsai
研究成果: Conference contribution › 同行評審