The understanding of the bulk trigate MOSFET's reliability through the manipulation of RTN traps

E. R. Hsieh, P. C. Wu, Steve S. Chung, C. H. Tsai, R. M. Huang, C. T. Tsai

研究成果: Conference contribution同行評審

指紋 深入研究「The understanding of the bulk trigate MOSFET's reliability through the manipulation of RTN traps」主題。共同形成了獨特的指紋。

Engineering & Materials Science