The enhancement of gate-induced-drain-leakage (GIDL) current in SOI MOSFET and its impact on SOI device scaling

Jian Chen, Fariborz Assaderaghi, Ping Keung Ko, Chen-Ming Hu

研究成果: Conference contribution同行評審

6 引文 斯高帕斯(Scopus)
原文English
主出版物標題1992 IEEE International SOI Conference, SOI 1992 - Proceedings
發行者Institute of Electrical and Electronics Engineers Inc.
頁面84-85
頁數2
ISBN(電子)0780307763
DOIs
出版狀態Published - 1 一月 1992
事件1992 IEEE International SOI Conference, SOI 1992 - Ponte Vedra Beach, United States
持續時間: 6 十月 19928 十月 1992

出版系列

名字Proceedings - IEEE International SOI Conference
ISSN(列印)1078-621X

Conference

Conference1992 IEEE International SOI Conference, SOI 1992
國家United States
城市Ponte Vedra Beach
期間6/10/928/10/92

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