Testing retention flip-flops in power-gated designs

Hao Wen Hsu, Shih Hua Kuo, Wen Hsiang Chang, Shi Hao Chen, Ming Tung Chang, Chia-Tso Chao

研究成果: Conference contribution同行評審

2 引文 斯高帕斯(Scopus)

指紋 深入研究「Testing retention flip-flops in power-gated designs」主題。共同形成了獨特的指紋。

Engineering & Materials Science