Temperature effect on read current in a two-bit nitride-based trapping storage flash EEPROM cell
Mu Yi Liu*, Yao Wen Chang, Nian Ki Zous, Ichen Yang, Tao Cheng Lu, Ta-Hui Wang, Wenchi Ting, Joseph Ku, Chih Yuan Lu
*Corresponding author for this work
研究成果: Article › 同行評審