In this paper, we present a syndrome test methodology for the testing of unscanned interconnects in a boundary scan environment. Mathematical equations are derived for the relationship of test length, faulty-free and faulty syndromes, and tolerable error rate. To calculate fault-free and faulty syndromes, we propose an event driven syndrome simulation algorithm. To shorten testing time and reduce test cost, we transform and solved the problem as a set covering problem.
|頁（從 - 到）||62-67|
|期刊||Proceedings of the Asian Test Symposium|
|出版狀態||Published - 1 十二月 1996|
|事件||Proceedings of the 1996 5th Asian Test Symposium, ATS'96 - Hsinchu, Taiwan|
持續時間: 20 十一月 1996 → 22 十一月 1996