Syndrome simulation and syndrome test for unscanned interconnects

Chau-Chin Su*, Shyh Shen Hwang, Shyh-Jye Jou, Yuan Tzu Ting

*Corresponding author for this work

研究成果: Conference article同行評審

2 引文 斯高帕斯(Scopus)

摘要

In this paper, we present a syndrome test methodology for the testing of unscanned interconnects in a boundary scan environment. Mathematical equations are derived for the relationship of test length, faulty-free and faulty syndromes, and tolerable error rate. To calculate fault-free and faulty syndromes, we propose an event driven syndrome simulation algorithm. To shorten testing time and reduce test cost, we transform and solved the problem as a set covering problem.

原文English
文章編號5565433
頁(從 - 到)62-67
頁數6
期刊Proceedings of the Asian Test Symposium
DOIs
出版狀態Published - 1 十二月 1996
事件Proceedings of the 1996 5th Asian Test Symposium, ATS'96 - Hsinchu, Taiwan
持續時間: 20 十一月 199622 十一月 1996

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