Surface profiling measurement using varifocal lens based on focus stacking

Chen Liang Fan, Chun Jen Weng*, Yu Hsin Lin, Pi-Ying Cheng

*Corresponding author for this work

研究成果: Conference contribution同行評審

3 引文 斯高帕斯(Scopus)

摘要

In this study, we developed a 3D surface profiling technique based on a varifocal lens and focus-stacking method that uses a high-pass filter in conjunction with a focus algorithm. The varifocal lens was used in conjunction with a CCD camera to capture images of samples from various distances. The focus stacking method was then used to construct a surface profile and the image with large depth-of-filed.

原文English
主出版物標題I2MTC 2018 - 2018 IEEE International Instrumentation and Measurement Technology Conference
主出版物子標題Discovering New Horizons in Instrumentation and Measurement, Proceedings
發行者Institute of Electrical and Electronics Engineers Inc.
頁面1-5
頁數5
ISBN(電子)9781538622223
DOIs
出版狀態Published - 10 七月 2018
事件2018 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2018 - Houston, United States
持續時間: 14 五月 201817 五月 2018

出版系列

名字I2MTC 2018 - 2018 IEEE International Instrumentation and Measurement Technology Conference: Discovering New Horizons in Instrumentation and Measurement, Proceedings

Conference

Conference2018 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2018
國家United States
城市Houston
期間14/05/1817/05/18

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