Surface modification of YBa 2 Cu 3 O y thin films with a scanning tunneling microscope

Sufen Chen*, L. M. Wang, Wen-Bin Jian, S. Y. Wang, H. C. Yang, H. E. Horng

*Corresponding author for this work

研究成果: Article同行評審

3 引文 斯高帕斯(Scopus)

摘要

We report a systematic modification of thin YBa 2 Cu 3 O y films with a scanning tunneling microscope. The samples include YBa 2 Cu 3 O y films on MgO(001) and YBa 2 Cu 3 O y /PrBa 2 Cu 3 O y bilayer films on SrTiO 3 (001). The bias voltage of the tip was kept negative and varied from -600 to -1200 mV. The tip was operated in a constant tunneling current mode with tunneling current 0.3-0.7 nA and scanning rate 1 Hz. Modification of the surface begins with nucleation of holes, or at the edge of a dislocation or protrusion on the surface, and is achieved by successively scanning a fixed area. We show the image obtained from an atomic force microscope which can help us look into the mechanism of the modification.

原文English
頁(從 - 到)2535-2537
頁數3
期刊Journal of Applied Physics
76
發行號4
DOIs
出版狀態Published - 1 十二月 1994

指紋 深入研究「Surface modification of YBa <sub>2</sub> Cu <sub>3</sub> O <sub>y</sub> thin films with a scanning tunneling microscope」主題。共同形成了獨特的指紋。

引用此