Statistical investigation on the variation behavior of low-temperature poly- Si TFTs for circuit simulation

Shih Che Huang*, Guo Feng Peng, Jyh Long Chern, Ya-Hsiang Tai

*Corresponding author for this work

研究成果: Conference article

3 引文 斯高帕斯(Scopus)

摘要

In this paper, the variation characteristics of LTPS TFTs are statistically investigated. A description is proposed to fit the variation behaviors, which the coefficient of determination is higher than 0.95, reflecting the validation of the model. Furthermore, the proposed models are used to simulate the performance of the differential pair.

原文English
頁(從 - 到)329-332
頁數4
期刊Digest of Technical Papers - SID International Symposium
37
發行號1
DOIs
出版狀態Published - 1 一月 2006
事件44th International Symposium, Seminar, and Exhibition, SID 2006 - San Francisco, CA, United States
持續時間: 4 六月 20069 六月 2006

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