Simulation of P- and N-MOSFET hot-carrier degradation in CMOS circuits

P. M. Lee, T. Garfinkel, P. K. Ko, Chen-Ming Hu

研究成果: Conference contribution同行評審

7 引文 斯高帕斯(Scopus)

指紋 深入研究「Simulation of P- and N-MOSFET hot-carrier degradation in CMOS circuits」主題。共同形成了獨特的指紋。

Physics & Astronomy

Chemical Compounds

Engineering & Materials Science