Simulation of grain-boundary induced Vth variability in stackable NAND flash using a Voronoi approach

Ching Wei Yang, Shao Heng Chao, Pin Su

研究成果: Conference contribution同行評審

指紋 深入研究「Simulation of grain-boundary induced V<sub>th</sub> variability in stackable NAND flash using a Voronoi approach」主題。共同形成了獨特的指紋。

Engineering & Materials Science