Simulation and investigation of random grain-boundary-induced variabilities for stackable NAND flash using 3-D voronoi grain patterns

Ching Wei Yang, Pin Su

研究成果: Article同行評審

18 引文 斯高帕斯(Scopus)

指紋 深入研究「Simulation and investigation of random grain-boundary-induced variabilities for stackable NAND flash using 3-D voronoi grain patterns」主題。共同形成了獨特的指紋。

Chemical Compounds

Engineering & Materials Science