Self-heating induced feedback effect on drain current mismatch and its modeling

Jack J.Y. Kuo*, Pin Su

*Corresponding author for this work

研究成果: Conference contribution同行評審

摘要

We have reported and modeled a self-heating induced feedback effect on the drain current mismatch of nanoscale MOSFETs. The accuracy of the new model has been verified with experimental data. This effect needs to be considered when one-to-one comparisons between SOI and bulk devices regarding the variability are made.

原文English
主出版物標題2011 International Electron Devices Meeting, IEDM 2011
DOIs
出版狀態Published - 1 十二月 2011
事件2011 IEEE International Electron Devices Meeting, IEDM 2011 - Washington, DC, United States
持續時間: 5 十二月 20117 十二月 2011

出版系列

名字Technical Digest - International Electron Devices Meeting, IEDM
ISSN(列印)0163-1918

Conference

Conference2011 IEEE International Electron Devices Meeting, IEDM 2011
國家United States
城市Washington, DC
期間5/12/117/12/11

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