Scaling effects on gate leakage current

Watanabe Hiroshi*, Kazuya Matsuzawa, Shin Ichi Takagi

*Corresponding author for this work

研究成果: Article同行評審

15 引文 斯高帕斯(Scopus)

指紋 深入研究「Scaling effects on gate leakage current」主題。共同形成了獨特的指紋。

Chemical Compounds

Engineering & Materials Science