Reliability studies of 0.85-μm VCELs

K. Tai*, C. C. Wu, Kai-Feng Huang

*Corresponding author for this work

研究成果: Conference contribution同行評審

1 引文 斯高帕斯(Scopus)

摘要

The paper reports reliability studies on 45 randomly selected 0.85 micrometer vertical cavity surface emitting lasers (VCELs). These layers were prepared by one-step molecular beam epitaxy and proton implantation. The threshold currents at 25 °C vary from 3.8 to 4 mA. The biased voltages at the threshold vary from 2.2 to 2.3 V. The low bias voltage allows the maximum cw operating temperature of the lasers to exceed 100 °C.

原文English
主出版物標題Conference on Optical Fiber Communication, Technical Digest Series
頁面105-106
頁數2
出版狀態Published - 1 一月 1994
事件Proceedings of the 1994 Optical Fiber Communication Conference - San Jose, CA, USA
持續時間: 20 二月 199425 二月 1994

出版系列

名字Conference on Optical Fiber Communication, Technical Digest Series
4

Conference

ConferenceProceedings of the 1994 Optical Fiber Communication Conference
城市San Jose, CA, USA
期間20/02/9425/02/94

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