Random dopant induced fluctuations of characteristics in deep sub-micron MOSFETs

Hung Mu Chou, Shih Ching Lo, Jyun Hwei Tsai, Yiming Li*

*Corresponding author for this work

研究成果: Conference contribution同行評審

指紋 深入研究「Random dopant induced fluctuations of characteristics in deep sub-micron MOSFETs」主題。共同形成了獨特的指紋。

Engineering & Materials Science