Optimal wafer probe testing and diagnosis of k-out-of-n structures

Ming-Feng Chang*, Weiping Shi, W. Kent Fuchs

*Corresponding author for this work

研究成果: Conference contribution同行評審

摘要

The authors investigate wafer probing strategies for the diagnosis of repairable VLSI and WSI (wafer scale integration) structures based on integrated diagnosis and repair. Knowledge of the repair strategy, the probability of each unit being good, and the expected test time of each unit are used by the diagnosis algorithm to select units for wafer probe testing. The general problem is described followed by an examination of a specific case. Wafer probe diagnosis of k-out-of-n systems is analyzed and optimal diagnosis algorithms are derived. A compact representation of the optimal diagnosis scheme which needs O(n 2 ) space and can be generated in O(n 2 ) time is described.

原文English
主出版物標題IEEE Int Conf Comput Aided Des ICCAD 89 Dig Tech Pap
編輯 Anon
發行者Publ by IEEE
頁面238-241
頁數4
ISBN(列印)0818659866
DOIs
出版狀態Published - 1 十二月 1989
事件IEEE International Conference on Computer-Aided Design (ICCAD-89): Digest of Technical Papers - Santa Clara, CA, USA
持續時間: 5 十一月 19899 十一月 1989

出版系列

名字IEEE Int Conf Comput Aided Des ICCAD 89 Dig Tech Pap

Conference

ConferenceIEEE International Conference on Computer-Aided Design (ICCAD-89): Digest of Technical Papers
城市Santa Clara, CA, USA
期間5/11/899/11/89

指紋 深入研究「Optimal wafer probe testing and diagnosis of k-out-of-n structures」主題。共同形成了獨特的指紋。

引用此