Optical inspection algorithm for dust defect of compact camera module

Yi Ju Wu, Li Yin Chen*, Mei Ju Lu

*Corresponding author for this work

研究成果: Conference contribution同行評審

2 引文 斯高帕斯(Scopus)

指紋 深入研究「Optical inspection algorithm for dust defect of compact camera module」主題。共同形成了獨特的指紋。

Mathematics

Physics & Astronomy

Chemical Compounds

Engineering & Materials Science