On the design of power-rail ESD clamp circuits with gate leakage consideration in nanoscale CMOS technology

Ming-Dou Ker, Chih Ting Yeh

研究成果: Article同行評審

11 引文 斯高帕斯(Scopus)

摘要

CMOS technology has been widely used to produce many integrated circuits. However, the thinner gate oxide in nanoscale CMOS technology seriously increases the difficulty of electrostatic discharge (ESD) protection design. The power-rail ESD clamp circuit has been the key circuit to perform the whole-chip ESD protection scheme. Some ESD detection circuits were developed to trigger on ESD devices across the power rails to quickly discharge ESD current away from the internal circuits. Therefore, on-chip ESD protection circuits must be designed with the consideration of standby leakage to minimize the power consumption and the possibility of malfunction to normal circuit operation. The design of power-rail ESD clamp circuits with low standby leakage current and high efficiency of layout area in nanoscale CMOS technology is reviewed in this paper. The comparisons among those power-rail ESD clamp circuits are also discussed.

原文English
文章編號6587810
頁(從 - 到)536-544
頁數9
期刊IEEE Transactions on Device and Materials Reliability
14
發行號1
DOIs
出版狀態Published - 1 一月 2014

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