Novel high performance and reliability p-type floating gate N-channel flash EEPROM

Steve S. Chung*, C. M. Yih, S. T. Liaw, Z. H. Ho, S. S. Wu, C. J. Lin, D. S. Kuo, M. S. Liang

*Corresponding author for this work

研究成果: Conference article › 同行評審

9 引文 斯高帕斯（Scopus）

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Engineering & Materials Science