Novel ESD implantation for sub-quarter-micron CMOS technology with enhanced machine-model ESD robustness

Ming-Dou Ker, Hsin Chyh Hsu, Jeng Jie Peng

研究成果: Conference contribution同行評審

1 引文 斯高帕斯(Scopus)

指紋 深入研究「Novel ESD implantation for sub-quarter-micron CMOS technology with enhanced machine-model ESD robustness」主題。共同形成了獨特的指紋。

Engineering & Materials Science