New transient detection circuit for Electrical Fast Transient (EFT) protection design in display panels

Ming-Dou Ker*, Wan Yen Lin, Cheng Cheng Yen, Che Ming Yang, Tung Yang Chen, Shih Fan Chen

*Corresponding author for this work

研究成果: Conference contribution同行評審

5 引文 斯高帕斯(Scopus)

摘要

A new transient detection circuit against electrical fast transient (EFT) disturbance is proposed for display panel protection. The circuit function to detect positive or negative electrical transients under EFT tests has been investigated in HSPICE simulation and verified in silicon chip. The output of the proposed transient detection circuit can be used as a firmware index to execute system automatic recovery operation. With hardware/firmware co-design, the immunity of display panel against transient disturbance under EFT tests can be significantly improved.

原文English
主出版物標題2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010
頁面51-54
頁數4
DOIs
出版狀態Published - 20 八月 2010
事件2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010 - Grenoble, France
持續時間: 2 六月 20104 六月 2010

出版系列

名字2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010

Conference

Conference2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010
國家France
城市Grenoble
期間2/06/104/06/10

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