Nanosized-metal-grain-induced characteristic fluctuation in gate-all-around si nanowire metal-oxide-semiconductor devices

Chun Ning Lai, Chien Yang Chen, Yi-ming Li

研究成果: Conference contribution同行評審

2 引文 斯高帕斯(Scopus)

指紋 深入研究「Nanosized-metal-grain-induced characteristic fluctuation in gate-all-around si nanowire metal-oxide-semiconductor devices」主題。共同形成了獨特的指紋。

Chemical Compounds

Engineering & Materials Science