Monte Carlo simulation of random dopant fluctuation in C-V characteristics using image charge model and adequately determined length scale

Yao Chih-Wei, Nobuyuki Sano, Hiroshi Watanabe

研究成果: Article同行評審

指紋 深入研究「Monte Carlo simulation of random dopant fluctuation in C-V characteristics using image charge model and adequately determined length scale」主題。共同形成了獨特的指紋。

Engineering & Materials Science

Physics & Astronomy