Mitigating lifetime underestimation: A system-level approach considering temperature variations and correlations between failure mechanisms

Kai-Chiang Wu*, Ming Chao Lee, Diana Marculescu, Shih Chieh Chang

*Corresponding author for this work

研究成果: Conference contribution同行評審

8 引文 斯高帕斯(Scopus)

摘要

Lifetime (long-term) reliability has been a main design challenge as technology scaling continues. Time-dependent dielectric breakdown (TDDB), negative bias temperature instability (NBTI), and electromigration (EM) are some of the critical failure mechanisms affecting lifetime reliability. Due to the correlation between different failure mechanisms and their significant dependence on the operating temperature, existing models assuming constant failure rate and additive impact of failure mechanisms will underestimate the lifetime of a system, usually measured by mean-time-to-failure (MTTF). In this paper, we propose a new methodology which evaluates system lifetime in MTTF and relies on Monte-Carlo simulation for verifying results. Temperature variations and the correlation between failure mechanisms are considered so as to mitigate lifetime underestimation. The proposed methodology, when applied on an Alpha 21264 processor, provides less pessimistic lifetime evaluation than the existing models based on sum of failure rate. Our experimental results also indicate that, by considering the correlation of TDDB and NBTI, the lifetime of a system is likely not dominated by TDDB or NBTI, but by EM or other failure mechanisms.

原文English
主出版物標題Proceedings - Design, Automation and Test in Europe Conference and Exhibition, DATE 2012
頁面1269-1274
頁數6
DOIs
出版狀態Published - 24 五月 2012
事件15th Design, Automation and Test in Europe Conference and Exhibition, DATE 2012 - Dresden, Germany
持續時間: 12 三月 201216 三月 2012

出版系列

名字Proceedings -Design, Automation and Test in Europe, DATE
ISSN(列印)1530-1591

Conference

Conference15th Design, Automation and Test in Europe Conference and Exhibition, DATE 2012
國家Germany
城市Dresden
期間12/03/1216/03/12

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