Mechanism of snapback failure induced by the latch-up test in high-voltage CMOS integrated circuits

Jen Chou Tseng*, Yu Lin Chen, Chung Ti Hsu, Fu Yi Tsai, Po An Chen, Ming-Dou Ker

*Corresponding author for this work

研究成果: Conference contribution同行評審

3 引文 斯高帕斯(Scopus)

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Engineering & Materials Science