Measuring process capability based on Cpmk with gauge measurement errors

B. M. Hsu, M. H. Shu*, W.l. Pearn

*Corresponding author for this work

研究成果: Article同行評審

20 引文 斯高帕斯(Scopus)

指紋 深入研究「Measuring process capability based on C<sub>pmk</sub> with gauge measurement errors」主題。共同形成了獨特的指紋。

Business & Economics

Engineering & Materials Science