Measuring manufacturing capability based on lower confidence bounds of Cpmk applied to current transmitter process

W.l. Pearn*, Ming Hung Shu

*Corresponding author for this work

研究成果: Article同行評審

14 引文 斯高帕斯(Scopus)

指紋 深入研究「Measuring manufacturing capability based on lower confidence bounds of C<sub>pmk</sub> applied to current transmitter process」主題。共同形成了獨特的指紋。

Engineering & Materials Science