Mapping technological trajectory as patent analysis and delphi investigation

P. C. Lee, Hsin-Ning Su

研究成果: Conference contribution同行評審

1 引文 斯高帕斯(Scopus)

指紋 深入研究「Mapping technological trajectory as patent analysis and delphi investigation」主題。共同形成了獨特的指紋。

Engineering & Materials Science