Silicon-controlled rectifier (SCR) has been used as an effective on-chip ESD protection device in CMOS technology due to the highest ESD robustness. In this work, the waffle layout structure for SCR can achieve smaller parasitic capacitance under the same ESD robustness. With smaller parasitic capacitance, the degradation on RF circuit performance due to ESD protection device can be reduced. The proposed waffle SCR with low parasitic capacitance is suitable for on-chip ESD protection in RF ICs.
|主出版物標題||Proceedings of the 2007 IEEE Radio Frequency Integrated Circuits Symposium, RFIC 2007|
|出版狀態||Published - 2 十月 2007|
|事件||2007 IEEE Radio Frequency Integrated Circuits Symposium, RFIC 2007 - Honolulu, HI, United States|
持續時間: 3 六月 2007 → 5 六月 2007
|名字||Digest of Papers - IEEE Radio Frequency Integrated Circuits Symposium|
|Conference||2007 IEEE Radio Frequency Integrated Circuits Symposium, RFIC 2007|
|期間||3/06/07 → 5/06/07|