Kinetics of Pd2Si layer growth measured by an x-ray diffraction technique

Betty Coulman*, Haydn Chen

*Corresponding author for this work

研究成果: Article同行評審

33 引文 斯高帕斯(Scopus)

指紋 深入研究「Kinetics of Pd<sub>2</sub>Si layer growth measured by an x-ray diffraction technique」主題。共同形成了獨特的指紋。

Physics & Astronomy