Intrinsic parameter fluctuations on current mirror circuit with different aspect ratio of 16-nm Multi-Gate MOSFET

Hui Wen Cheng, Chun Yen Yiu, Thet Thet Khaing, Yiming Li*

*Corresponding author for this work

研究成果: Conference contribution同行評審

1 引文 斯高帕斯(Scopus)

指紋 深入研究「Intrinsic parameter fluctuations on current mirror circuit with different aspect ratio of 16-nm Multi-Gate MOSFET」主題。共同形成了獨特的指紋。

Engineering & Materials Science