@inproceedings{37704ca5485947879728911380a4386a,
title = "Innovative pixel-inversion calculation for model-based sub-resolution assist features and optical proximity correction",
abstract = "We propose an inversion calculation method based on a simple {"}pixel-flipping{"} approach. The simple method features innovative wavefront-expansion and wavefront-based damping techniques in order to obtain accentuated corrections near the drawn pattern. The method is first employed to be a stand-alone optical proximity correction solution that directly calculates the corrected masks with acceptable contours and image contrast. In addition, a model-based pre-OPC flow, where the initial sizing of drawn patterns and surrounding sub-resolution assist features (SRAF) are simultaneously generated in a single iteration using this inversion calculation is also proposed to minimize technology-transition risks and costs. A mask simplification technique based on the central moments is introduced in order to snap the corrections into 45 degree and axis-aligned line segments. This approach allows achieving optimized corrections while minimizing the impact to the existing and validated correction flow.",
keywords = "Convergence, Inversion calculation, Optical proximity correction, Sub-resolution assist features",
author = "Yu, {Jue Chin} and Pei-Chen Yu and Chao, {Hsueh Yung}",
year = "2009",
month = may,
day = "29",
doi = "10.1117/12.814413",
language = "English",
isbn = "9780819475275",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
booktitle = "Optical Microlithography XXII",
note = "null ; Conference date: 24-02-2009 Through 27-02-2009",
}