Improving the accuracy of the leakage power estimation of embedded CPUs

Ting Wu Chin, Shiao-Li Tsao, Kuo Wei Hung, Pei Shu Huang

研究成果: Conference contribution同行評審

摘要

Previous studies have used on-chip thermal sensors (diodes) to estimate the leakage power of a CPU. However, an embedded CPU equips only a few thermal sensors and may suffer from considerable spatial temperature variances across the CPU core, and leakage power estimation based on insufficient temperature information introduces errors. According to our experiments, the conventional leakage power models may have up to 22.9% estimation error for a 70-nm embedded CPU. In this study, we first evaluated the accuracy of leakage power estimates based on thermal sensors on different locations of a CPU and suggested locations that can reduce the error to 0.9%. Then, we proposed temperature-referred and counter-tracked estimation (TRACE) that relies on temperature sensors and hardware activity counters to estimate leakage power. The simulation results demonstrated that employing TRACE could reduce the error to 3.4%. Experiments were also conducted on a real platform to verify our findings.

原文English
主出版物標題Proceedings of the 2017 Design, Automation and Test in Europe, DATE 2017
發行者Institute of Electrical and Electronics Engineers Inc.
頁面1233-1236
頁數4
ISBN(電子)9783981537093
DOIs
出版狀態Published - 11 五月 2017
事件20th Design, Automation and Test in Europe, DATE 2017 - Swisstech, Lausanne, Switzerland
持續時間: 27 三月 201731 三月 2017

出版系列

名字Proceedings of the 2017 Design, Automation and Test in Europe, DATE 2017

Conference

Conference20th Design, Automation and Test in Europe, DATE 2017
國家Switzerland
城市Swisstech, Lausanne
期間27/03/1731/03/17

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