Impact of process-induced uniaxial strain on the temperature dependence of carrier mobility in nanoscale pMOSFETs

William P N Chen, Jack J Y Kuo, Pin Su

研究成果: Article同行評審

6 引文 斯高帕斯(Scopus)

指紋 深入研究「Impact of process-induced uniaxial strain on the temperature dependence of carrier mobility in nanoscale pMOSFETs」主題。共同形成了獨特的指紋。

Chemical Compounds

Engineering & Materials Science