Impact of Nanoscale Polarization Relaxation on Endurance Reliability of One-Transistor Hybrid Memory Using Combined Storage Mechanisms

Yu Chien Chiu, Chun-Yen Chang, Hsiao-Hsuan Hsu, Chun-Hu Cheng, Min Hung Lee

研究成果: Conference contribution › 同行評審

1 引文 斯高帕斯（Scopus）

指紋 深入研究「Impact of Nanoscale Polarization Relaxation on Endurance Reliability of One-Transistor Hybrid Memory Using Combined Storage Mechanisms」主題。共同形成了獨特的指紋。

Physics & Astronomy