IIIB-1 Degradation of 77-K MOSFET Characteristics Due to Channel Hot Electrons

Jack Y.C. Sun, Matthew R. Wordeman

研究成果: Article › 同行評審

8 引文斯高帕斯（Scopus）

原文	English
頁（從 - 到）	1970
頁數	1
期刊	IEEE Transactions on Electron Devices
卷	31
發行號	12
DOIs	https://doi.org/10.1109/T-ED.1984.21849
出版狀態	Published - 十二月 1984

存取文件

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