Finite element analysis of antireflective silicon nitride sub-wavelength structures for solar cell applications

Huang Ming Lee, Kartika Chandra Sahoo, Yiming Li, Jong Ching Wu*, Edward Yi Chang

*Corresponding author for this work

研究成果: Article同行評審

7 引文 斯高帕斯(Scopus)

摘要

We numerically calculate the spectral reflectivity of the silicon nitride (Si3N4) sub-wavelength structure (SWS) using a two-dimensional finite element simulation. The geometry-dependent effective reflectance of the Si3N4 SWS over the wavelength ranging from 400 nm to 1000 nm is examined and the structure of Si3N 4 SWS is further optimized for the lowest effective reflectance. A p-n junction solar cell efficiency based on the optimized Si3N 4 SWS is also calculated, resulting in an improvement of 0.98% in efficiency than that of single layer antireflection coatings.

原文English
頁(從 - 到)7204-7208
頁數5
期刊Thin Solid Films
518
發行號24
DOIs
出版狀態Published - 1 十月 2010

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