Fabrication and X-ray absorption spectroscopy in layered cobaltate Na x CoO 2 thin films

W. J. Chang*, Jiunn-Yuan Lin, T. Y. Chung, J. M. Chen, C. H. Hsu, S. Y. Hsu, T. M. Uen, Kaung-Hsiung Wu, Y. S. Gou, Jenh-Yih Juang

*Corresponding author for this work

研究成果: Article同行評審

2 引文 斯高帕斯(Scopus)

摘要

Na x CoO 2 (x∼0.68) thin films were fabricated on sapphire (0 0 0 1) substrates via the lateral diffusion of sodium into Co 3 O 4 (1 1 1) films, which were grown by pulsed-laser deposition. From the results of X-ray diffraction and in-plane resistivity ρ ab , the single phase and the metallic behaviors of these Na x CoO 2 films can be identified. For the same sodium content x, ρ ab is consistent with that of single crystals. In addition, the O 1s X-ray absorption near edge spectra of thin films are measured and compared with those of single crystals.

原文English
期刊Journal of Magnetism and Magnetic Materials
310
發行號2 SUPPL. PART 2
DOIs
出版狀態Published - 1 三月 2007

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