Estimating process capability index Cpk: classical approach versus Bayesian approach

Wen Lea Pearn, Chin Chieh Wu, Chia Huang Wu*

*Corresponding author for this work

研究成果: Article同行評審

10 引文 斯高帕斯(Scopus)


Process capability index Cpk has been the most popular one used in the manufacturing industry dealing with problems of measuring reproduction capability of processes to enhance product development with very low fraction of defectives. In the manufacturing industry, lower confidence bound (LCB) estimates the minimum process capability providing pivotal information for quality engineers to monitoring the process and assessing process performance for quality assurance. The main objective of this paper is to compare and contrast the LCBs on Cpk using two approaches, Classical method and Bayesian method.

頁(從 - 到)2007-2021
期刊Journal of Statistical Computation and Simulation
出版狀態Published - 3 七月 2015

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