ESD protection design for fully integrated CMOS RF power amplifiers with waffle-structured SCR

Ming-Dou Ker*, Chun Yu Lin, Guo Xuan Meng

*Corresponding author for this work

研究成果: Conference contribution同行評審

3 引文 斯高帕斯(Scopus)

指紋 深入研究「ESD protection design for fully integrated CMOS RF power amplifiers with waffle-structured SCR」主題。共同形成了獨特的指紋。

Engineering & Materials Science