ESD protection design for fully integrated CMOS RF power amplifiers with waffle-structured SCR

Ming-Dou Ker*, Chun Yu Lin, Guo Xuan Meng

*Corresponding author for this work

研究成果: Conference contribution

3 引文 斯高帕斯(Scopus)

摘要

Waffle-structured SCR (silicon-controlled rectifier) has been studied as an effective on-chip ESD (electrostatic discharge) protection device for CMOS RF (radio-frequency) circuits. In this work, a novel on-chip ESD protection strategy using the waffle-structured SCR is proposed and co-designed with a CMOS UWB (ultra-wideband) PA (power amplifier). Before ESD stress, the RF performances of the ESD-protected PA have been demonstrated to be as well as that of the unprotected PA. After ESD stress, the unprotected PA was seriously degraded, whereas the ESD-protected PA was keeping the performances well.

原文English
主出版物標題2008 IEEE International Symposium on Circuits and Systems, ISCAS 2008
頁面1292-1295
頁數4
DOIs
出版狀態Published - 19 九月 2008
事件2008 IEEE International Symposium on Circuits and Systems, ISCAS 2008 - Seattle, WA, United States
持續時間: 18 五月 200821 五月 2008

出版系列

名字Proceedings - IEEE International Symposium on Circuits and Systems
ISSN(列印)0271-4310

Conference

Conference2008 IEEE International Symposium on Circuits and Systems, ISCAS 2008
國家United States
城市Seattle, WA
期間18/05/0821/05/08

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